Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement.

Título:
Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement.
Autor:
Ma , Yue
Materia:
Computer Science; Engineering & Technology
Editor:
CRC Press
Descripción:
240 p.
Identificadores:
ISBN: 9780429399619
Colección:
Taylor Francis