Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits.
- Título:
- Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits.
- Materia:
- Engineering & Technology
- Editor:
- CRC Press
- Descripción:
- 259 p.
- Identificadores:
- ISBN: 9781315217819
- Colección:
- Taylor Francis