Advances in Speckle Metrology and Related Techniques

Título:
Advances in Speckle Metrology and Related Techniques
Autor:
Kaufmann
Materia:
Electrical & Electronics Engineering
Editor:
Wiley-VCH
Descripción:
328 p.
Identificadores:
E-ISBN: 9783527409570 ISBN: 9783527633852
Colección:
Wiley