Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization

Título:
Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization
Autor:
Yablon
Materia:
Analytical Chemistry
Editor:
Wiley
Descripción:
369 p.
Identificadores:
E-ISBN: 9781118288238 ISBN: 9781118723111
Colección:
Wiley