Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Título:
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Autor:
Haugstad
Materia:
Analytical Chemistry
Editor:
Wiley
Descripción:
489 p.
Identificadores:
E-ISBN: 9780470638828 ISBN: 9781118360668
Colección:
Wiley