Electron Beam-Specimen Interactions and Simulation Methods in Microscopy

Título:
Electron Beam-Specimen Interactions and Simulation Methods in Microscopy
Autor:
Mendis
Materia:
Analytical Chemistry
Editor:
Wiley
Descripción:
297 p.
Identificadores:
E-ISBN: 9781118456095 ISBN: 9781118696545
Colección:
Wiley