Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications
- Título:
- Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications
- Materia:
- Electrical & Electronics Engineering
- Editor:
- Wiley-VCH
- Descripción:
- 345 p.
- Identificadores:
- E-ISBN: 9783527411528 ISBN: 9783527681075
- Colección:
- Wiley